SWIR Laser Beam Profilers | 400–2050 nm

Description

Short-Wave Infrared Beam Profiling

SWIR Laser Beam Profilers | 400–2050 nm

Six sensor configurations for beam analysis from the visible edge through the SWIR, covering compact high-resolution measurements and fast wide-area applications.

AI built inTest & Pass/Fail includedTurnkey, OEM or integration
Representative unbranded SWIR camera for an IZAK Scientific laser beam profiler
Representative unbranded SWIR camera. The supplied interface and cable kit are matched to the selected detector.

Choose your configuration

Select by spectral response, active width and spatial resolution. Frame rate and packaging are finalized according to the optical power, beam diameter and integration requirements.

32001SWIR Compact – 2.5 mm / 0.3 MPSpectral range400–1760 nmActive width2.5 mmResolution0.3 MP

SWIR Compact – 2.5 mm / 0.3 MP

Spectral range: 400–1760 nm. Active width: 2.5 mm. Resolution: 0.3 MP.

  • Live 2D/3D profiling and complete beam parameters
  • Test, Pass/Fail, reporting and AI analytics built in
  • Fractional/multiple-spot analysis, custom attenuation/optics and API/OEM integration available on request
SKU 32001GigE Vision 2.0 · 1GigE PoE · USB3 optionM12-to-RJ45 Cat6a and PoE/NIC, or same-sensor USB3 configuration.Request a quote
32002SWIR Standard – 5.2 mm / 1.3 MPSpectral range400–1760 nmActive width5.2 mmResolution1.3 MP

SWIR Standard – 5.2 mm / 1.3 MP

Spectral range: 400–1760 nm. Active width: 5.2 mm. Resolution: 1.3 MP.

  • Live 2D/3D profiling and complete beam parameters
  • Test, Pass/Fail, reporting and AI analytics built in
  • Fractional/multiple-spot analysis, custom attenuation/optics and API/OEM integration available on request
SKU 32002GigE Vision 2.0 · 1GigE PoE · USB3 optionM12-to-RJ45 Cat6a and PoE/NIC, or same-sensor USB3 configuration.Request a quote
32003SWIR High Resolution – 5.3 mm / 3.2 MPSpectral range400–1760 nmActive width5.3 mmResolution3.2 MP

SWIR High Resolution – 5.3 mm / 3.2 MP

Spectral range: 400–1760 nm. Active width: 5.3 mm. Resolution: 3.2 MP.

  • Live 2D/3D profiling and complete beam parameters
  • Test, Pass/Fail, reporting and AI analytics built in
  • Fractional/multiple-spot analysis, custom attenuation/optics and API/OEM integration available on request
SKU 32003GigE Vision 2.0 · 2.5GigE PoE · USB3 optionM12 X-coded-to-RJ45 Cat6a and 2.5GigE PoE/NIC, or same-sensor USB3 configuration.Request a quote
32004SWIR Large-Area – 7.1 mm / 5.2 MPSpectral range400–1760 nmActive width7.1 mmResolution5.2 MP

SWIR Large-Area – 7.1 mm / 5.2 MP

Spectral range: 400–1760 nm. Active width: 7.1 mm. Resolution: 5.2 MP.

  • Live 2D/3D profiling and complete beam parameters
  • Test, Pass/Fail, reporting and AI analytics built in
  • Fractional/multiple-spot analysis, custom attenuation/optics and API/OEM integration available on request
SKU 32004GigE Vision 2.0 · 2.5GigE PoE · USB3 optionM12 X-coded-to-RJ45 Cat6a and 2.5GigE PoE/NIC, or same-sensor USB3 configuration.Request a quote
32005Extended SWIR Fast – 10.2 mm / 0.3 MPSpectral range400–2050 nmActive width10.2 mmResolution0.3 MP

Extended SWIR Fast – 10.2 mm / 0.3 MP

Spectral range: 400–2050 nm. Active width: 10.2 mm. Resolution: 0.3 MP. Fast configuration.

  • Live 2D/3D profiling and complete beam parameters
  • Test, Pass/Fail, reporting and AI analytics built in
  • Fractional/multiple-spot analysis, custom attenuation/optics and API/OEM integration available on request
SKU 32005USB3 or GigE according to selected extended-SWIR detectorCable, power and host interface are defined in the quotation.Request a quote
32006NIR-SWIR Fast – 10.2 mm / 0.3 MPSpectral range900–1700 nmActive width10.2 mmResolution0.3 MP

NIR-SWIR Fast – 10.2 mm / 0.3 MP

Spectral range: 900–1700 nm. Active width: 10.2 mm. Resolution: 0.3 MP. Fast configuration.

  • Live 2D/3D profiling and complete beam parameters
  • Test, Pass/Fail, reporting and AI analytics built in
  • Fractional/multiple-spot analysis, custom attenuation/optics and API/OEM integration available on request
SKU 32006USB3 or GigE according to selected NIR-SWIR detectorCable, power and host interface are defined in the quotation.Request a quote

Included in every configuration

Beam analysis
Live 2D/3D profile, centroid, widths, ellipticity and orientation.
Production tools
Test sequences, Pass/Fail decisions and configurable reports.
Built-in AI analytics
Database analysis, trend detection and production/R&D insight.
Flexible delivery
Complete system, OEM module or integration with customer hardware.
Fractional and multiple-spot analysis, custom attenuation or optics, and API integration are available according to the application.

Request an engineered configuration

Select one or several model SKUs below. The form creates a New Opportunity in IZAK Scientific Bigin, notifies the owner and sends an email confirmation listing the selected models.

>Tzachi Sabati Tzachi Sabati
CEO, IZAK Scientific
Physicist specializing in photonics and quantum technologies, with deep expertise in quantum sensors and advanced optical systems. Leads the Advanced Quantum Lab course at the Technion, bridging academic excellence with industry innovation. At IZAK Scientific, provides cutting-edge photonics-based solutions, developing customized inspection and sensing systems for R&D and production. Passionate about advancing quantum sensing applications and integrating novel technologies to meet industry needs.

 

Reviews

There are no reviews yet.

Be the first to review “SWIR Laser Beam Profilers | 400–2050 nm”

Your email address will not be published. Required fields are marked *